Automated Detection of Counterfeit IC Defects Using Image Processing

Published in Government Microcircuit Applications & Critical Technologies Conference (GOMACTech), 2018

Recommended citation: S. Baireddy, U. J. Botero, N. Asadi, M. Tehranipoor, D. Woodard, and D. Forte. "Automated Detection of Counterfeit IC Defects Using Image Processing". Government Microcircuit Applications & Critical Technologies Conference (GOMACTech). March 2018. Miami, FL.