Plant Stem Segmentation Using Fast Ground Truth Generation

Published in IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI), 2020

Recommended citation: C. Yang, S. Baireddy, Y. Chen, E. Cai, D. Caldwell, V. Méline, A. S. Iyer-Pascuzzi, E. J. Delp. "Plant Stem Segmentation Using Fast Ground Truth Generation". IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI). March 2020. Santa Fe, NM.