Automated Detection of Counterfeit IC Defects Using Image Processing
S. Baireddy, U. J. Botero, N. Asadi, M. Tehranipoor, D. Woodard, and D. Forte. "Automated Detection of Counterfeit IC Defects Using Image Processing". Government Microcircuit Applications & Critical Technologies Conference (GOMACTech). March 2018. Miami, FL.